The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing.
Ultra-precise measuring techniques to detect variation of 10-12 ampere.
A total system from temperature control to data processing.
Completed automatic system by using up-dated computer techniques.
A full line up covering from laboratory uses to on-line production.
Calorie meter part
Compressor driving equipment
Refrigerating cycle
Compressor temperature chamber
Evaporator temperature chamber
Measuring part
Controller
Input scanner
Communications interface
Personal computer
Peripheral part
Chiller unit
Cooling water bath
Testing part
Exclusive test fixtures corresponding to various devices are prepared, and various testing baths are prepared corresponding to lot sizes and point number.
Temperature monitoring of testing bath
Temperature pattern control and stability monitoring interlocking to testing modes are executed.
Measuring control processing
Bias applied and voltage/current/light output to device are accurately executed and measured values are transferred to a personal computer.
Data processing
Interactive settings for aging testing are executed through a personal computer and sensitivity is automatically adjusted by a personal computer. In addition, measured values are stored into a disk and analytical data can be shown on a CRT as figure or table format and outputted.
Host computer communications
Enormous quantity of data got from again processing are transferred to a host computer, and storage. Management and high grade of analytical processing can be executed.
Opto-electronics devise
Laser diode (short wave, long wave), Photo diode, Opto-semiconductor module, Light emitting diode, LED dot display, EL display device
Temperature monitoring of testing bath
Zener diode, Tantalum capacitor, Mylar capacitor, IC card, VLSI, Transistor, MOS/FET, High frequency transistor, Thermistor, Peltier element, Switching element, Superconductivity element, Hole element
Measuring control processing
Bias applied and voltage/current/light output to device are accurately executed and measured values are transferred to a personal computer.
Electronic parts
Interactive settings for aging testing are executed through a personal computer and sensitivity is automatically adjusted by a personal computer. In addition, measured values are stored into a disk and analytical data can be shown on a CRT as figure or table format and outputted.
